Abstract
Co/Ni multilayers ordered according to a periodic, Fibonnacci and Thue Morse sequence have been obtained by Atomic Layer Deposition and a subsequent process of thermal reduction. The morphology of the multilayers was investigated by scanning electron microscopy, while longitudinal hysteresis curves were obtained by magneto-optical magnetometry of Kerr effect. The morphology of the films varies as a function of their sequence and thickness. Multilayers exhibit coercivities much higher than expected from samples synthesized with other methods. The control of the magnetic properties of multilayers, as a function of their sequence, may allow their use in spintronic devices.
| Original language | English |
|---|---|
| Article number | 020002 |
| Journal | Nano Express |
| Volume | 1 |
| Issue number | 2 |
| DOIs | |
| State | Published - 1 Sep 2020 |
Keywords
- Atomic layer deposition
- Co/ni multilayers
- Magnetic properties
- Magnetic thin films
- Micromagnetic simulations
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